Laser-induced functionalisation using excimer laser irradiation has been widely applied to transparent conductive oxide films. However, exploring suitable irradiation conditions is time-consuming and cost-ineffective as there are numerous routine film fabrication and analytical processes. Thus, we herein explored a real-time technique to monitor the laser-induced functionalisation of transparent conductive oxide films. We developed two types of monitoring apparatus, electrical and optical, and applied them to magnetron-sputtered Sn-doped In2O3 films grown on glass substrates and hydrogen-doped In2O3 films on glass or plastic substrates using a picosecond Nd:YAG pulsed laser. Both techniques could monitor the functionalisation from a change in properties of the films on glass substrates by laser irradiation, but electrical measurement was unsuitable for plastic samples because of a laser-induced degradation of the underlying plastic substrate, which harmed proper electrical contact. Instead, we demonstrated that the optical properties in the near-infrared region were suitable for the monitoring and the changes in the optical properties were visually detected in real-time by using a near-infrared camera.