The local electrical response in alkaline-doped CuInSe₂ films prepared by single step electrodeposition onto Cu substrates was studied by current sensing atomic force microscopy. The CIS films were prepared from single baths containing the dopant ions (Li, Na, K or Cs) and were studied by X-ray diffraction, scanning electron microscopy, energy dispersive X-ray spectroscopy and photocurrent response. Increased crystallinity and surface texturing as the ion size increases was observed as well as enhanced photocurrent response in Cs doped CIS. Li and Na doped films have larger conductivity than the undoped film while the K and Cs doped samples display shorter currents and the current images indicate strong charge accumulation in the K and Cs doped films forming surface capacitors. Corrected CAFM IV curves were adjusted with Shockley equation.