This paper seeks to examine how the Mn-Co spinel interconnect coating microstructure can in-fluence the Cr contamination in an oxygen electrode of intermediate temperature Solid Oxide Cells at the operating temperature of 750 °C. A Mn-Co spinel coating is processed on Crofer 22 APU substrates by electrophoretic deposition and subsequently sintered following both the one-step and two-step sintering, in order to obtain significantly different densification levels. The electrochemical characterization is performed on anode supported cells with a LSCF cathode. The cells were aged prior to the electrochemical characterization in contact with the spinel coated Crofer 22 APU at 750 °C for 250 hours. Current-voltage and impedance spectra of the cells were measured after the exposure with the interconnect. Post-mortem analysis of the interconnect and the cell was carried out in order to assess the Cr retention capability of coatings with different microstructures.