3.5. Current-Voltage Characteristics
Figure 7 presents the set of current-voltage I(U) characteristics for the NBT single crystals. For the longest duration of the applied electric field, we are dealing with so-called saturation. Analysis of the I(U) characteristics showed that the classical Ohm’s law was obeyed at low values of the applied electric field, and the range of its applicability strongly depends on the measurement duration. Linear fragments can be distinguished in I(U) curves with different slopes, satisfying the relationship [
21]:
Figure 7h shows as a “double” logarithmic (log-log) plot of the I(U) relationship at 210°C. The I(U) curve shows the adjustment values of the
n parameter measured at a given voltage of 5kV/cm. As can be seen, approximately agreement with Ohm’s law has been ascertained at low electric field strength. When certain voltage limits are exceeded, the I(U) angle increases, which suggests a decrease in resistance and a change in the conduction mechanism. At higher temperatures and voltages, the material begins to exhibit semiconductor properties, which is related to the thermal activation of electric charge carriers and easier injection of carriers into the material. Further increasing the temperature and voltage leads to conduction, which agrees with the
space-
charge-
limited current (
SCLC) theory [
40]. According to this theory, material defects are a source of trap states in which trapped charge carriers are excited only by a high external electric field and thermal energy. The concentration of excess injected charges at high electric field is greater that of thermal equilibrium charges. As the temperature increases, the concentration of equilibrium charges (holes and electrons) increases, which may lead to the appearance of
SCLC space charge towards higher electric fields, which is confirmed by the results presented in
Figure 7. When the electric field reaches the
trap-
filled limited (
TFL), the electric current increases faster and the I(U) characteristics depend on the trap distribution according to the relationship I ~ U
n (n = 2, 4 ...).
In order to determine the transition point between behavior consistent with Ohm’s law and the
SCLC rule, the voltage value is introduced, as defined by the formula [
21,
41]:
where e – electron charge, d – sample thickness, n – thermal equilibrium of the density of free carriers, ε – electrical permittivity of the material, ε
0 – vacuum electrical permittivity, and θ – a coefficient determining the degree of charge trapping, given by the formula:
where n
t – density of trapped charges, N
c – density of states in the conduction band, N
t – trap density, g = 2 – degradation coefficient, E
t – trap energy below the edge of the conduction band E
c. From relation (3) we get:
where: e – electron charge (1.602x10
-19 C), d – sample thickness (0.0005m), ε=3746, ε
0 =8.85*10
-12 F/m, μ =10
-10 m
2/Vs, V
SCLC = 60 V. The θ coefficient determined from the above equation is 1.97 ×10
−2 for a temperature of 150°C (below T
d). The estimated value is consistent with literature data for materials with a perovskite structure [
21,
42].
Based on the experimental data, the density of traps N
t and the trap-filled limited voltage V
TFL was calculated for selected temperatures of 150, 170 and 210℃. The obtained values are summarized in Table 1. As the value of the applied electric field increases, the value of the V
TFL voltage, at which the traps are filled, decreases. At a temperature of 170℃, a significant increase in the V
TFL voltage is observed, resulting from the presence of the depolarization phenomenon. For 210℃, i.e., above the depolarization temperature, the same V
TFL value is recorded as at 150℃, but for a much higher field E=20 kV/cm. Based on the analysis of these relationships, the presence of shallow traps in the discussed material is confirmed [
21,
42].
Another explanation of the current-voltage characteristics is presented in paper [
43], i.e., an overlapping reversible insulator-metal transition (resistive switching) on nanoscales caused by the electric field. As a result of non-stoichiometry, both point and extension defects (shear planes) may appear in perovskites. In our NBT single crystals non-stoichiometry exists (see SEM and XPS results). In particular, a deficiency of oxygen is observed. As shown in paper [
43], a tendency toward vacancy clustering is observed. This ordering dominates in temperature range below the Tamman temperature, which is about half of the melting temperature (about 600°C for NBT single crystals), which included the temperature range over which the current-voltage characteristics were measured in the present paper. For low concentration of vacancies, the oxygen defects can be ordered along columns with different lengths of each segment and the segments (further called filaments) can be statistically distributed in the matrix [
43]. Increasing oxygen nonstoichiometry leads to a rapid increase of the number of these filaments and introduces an additional parallel orientation between them lying close to each other. In consequence, oxygen defects are not randomly distributed but tend to arrange in regular patterns. Conduction of the filaments relative to the matrix is 4-5 orders of magnitude higher [
43]. It was concluded, that reduction of the Ti valence as an effect of an enhanced local oxygen deficiency along the Ti-rich core of the edge shear planes (dislocations) causes the increase of the conductivity along the dislocations core with respect to the matrix i.e., electric transport is preferentially channeled along extension defects [
43].
At least two factors indicate the possibility of resistive-switching occurring in NBT single crystals when performing current-voltage characteristics: (1) the occurrence of current oscillations, which can be classified as a kind of unipolar self-switching (
Figure 7i), and (2) the presence of a network of dark stripes on the sample, which can be related to the carriers (oxygen) transport and current paths evolving throughout the sample [
43] (
Figure 7j).
3.7. Depolarization Current Results
Depolarization currents for samples polarized at different temperatures, times and electric fields are shown in
Figure 9. In general, three components with different angles of inclination and one nonlinear component can be distinguished, except
Figure 9d, where four components are visible for temperature 170°C. The first nonlinear component which appears is directly related to the domain reorientation process, and the others are related to various types of polarization, including ionic, dipole and electronic [
44]. Localized states (potential centers), e.g., ferroelectric/ferroelastic domain walls, point defects and inhomogeneity of the distribution of ions, which causes some occurrence of disorder in NBT. The latter is usual in perovskites with complex compositions such as NBT. Free charges as well as charges injected from electrodes at high electric field may be trapped on these centers. For example, an oxygen deficiency occurs in NBT (see EDS and XPS data), which leads to the appearance of long-range potential centers. After switching-off the applied electric field, charges which were trapped on localized states are released. This means that the sample is subjected to depolarization current flows through the sample [
37]. Due to technical limitations, it was not possible to measure currents in the temperature range 200-300℃, where rhombohedral and tetragonal phases coexist. At higher temperatures, charge transport between potential centers will play a significant role in both polarization and depolarization processes, as well as electrical conduction [
45].
The changes in discharge currents were described by the equation:
where I
d - depolarization (discharge) current intensity, t - time, s - exponent (dependent on polarization time and temperature) [
46]. At the beginning of the depolarization process, the parameter
s is approximately equal to zero, and then takes on larger values over time, eventually reaching or exceeding the value of one. The slope of the graph increases as the value of the polarization field increases, so the parameter
s takes on larger and larger values. Similar results were obtained for NBT ceramics [
46].
The course of changes in the value of the total depolarization charge Q
d depending on the discharge time at selected temperatures is shown in
Figure 10. The highest increase in the Q
d value is recorded in the first seconds of the depolarization process. As the temperature increases, the charge Q
d takes on higher values, which results mainly from the increased mobility of the charge.
3.9. Complex Impedance Spectroscopy Analysis
Figure 12 shows Nyquist plots Z’‘(Z’), in which the -Z’‘ and Z’ axes refer to the imaginary and real parts of the impedance, respectively. The obtained spectra have an overall shape resembling two semicircles whose maximum radius decreases with increasing temperature. The specificity of changes in the Z’ value as a function of temperature is characteristic of semiconductor materials. Seen in detail, the EIS spectra have the form of two partially separated semicircles. The first semicircle present in the high-frequency region (0.1 -10 MHz) could come from the sample (
Figure 12a) and the second one from double-layer capacitance occurring at the electrode-single crystal interface (
Figure 12b) [
47]. The second semicircle shows the highest impedance contribution and is located at medium and low frequencies between 10 kHz and 10 Hz. The analysis uses an electric equivalent circuit (EEC) composed of a parallel connection of a resistor R and a capacitor C or a constant model element (CPE) based on simple RC-RC model (EEC). The R
1 value is responsible for the resistance of the single crystal, and C
1 for its capacity, and R
2 value is related to the resistance of the interface phenomena, and C
2 for its capacitance at a given temperature [
48]. The values of the total electric resistance of sample were estimated based on EEC model. The EEC fitting line is not shown for the sake of clarity of the image of the experimental spectra and since it is of little importance for the interpretation of the obtained results.
The activation energy E
a was determined (based on R
1 data) as 1.1 eV using the Arrhenius formula in the temperature range from 475 to 600°C by fitting a straight line to the collected experimental data. The value of this activation energy and values of dc conductivity activation energies (1.18 and 1.14 eV) indicate that oxygen vacancies should be the most probable electric charge carriers in high-temperature range. On the other hand, the relationship between the width of the optical bandgap and the activation energy E
g∼2E
a, suggests that the conduction mechanism is consistent with intrinsic electronic conduction (i.e., the Fermi level is close to the midgap energy) in the analyzed temperature range. These results indicate two types of charge carriers i.e., oxygen vacancies and electrons in electric conductivity process. In turn, research conducted in papers [
46,
49] showed that an activation energy value above 2 eV is required for ion migration in NBT. However, this value of activation energy is valid for a stochiometric material, because any non-stoichiometry, particularly in the oxygen sublattice (oxygen loss) will lower this energy [
50].
Further analysis of the conduction mechanism includes tracking changes in the real Z’ and imaginary component -Z’‘ as a function of frequency at selected temperatures (
Figure 13). The real component Z’ (
Figure 13a) shows a sigmoidal evolution vs. frequency in the low-frequency region followed by a saturation region in the high-frequency region. In the examined temperature region of 100-600°C, the Z’ values were observed to be greater at lower frequencies. In the low-frequency region (under 10 kHz), it was observed that Z’ values diminished as the temperature rises from 400°C to 600°C. It can be also observed that over 400°C, peak positions shift to higher frequencies with increasing temperature. This suggests a decrease in the resistance of the bulk and electrode interface, which in turn implies an enhancement in the sample conductivity. However, the curves from various temperatures converged to a nearly plateau region at higher frequencies (above 100 kHz) (the arch-like region progressively shrinks with increasing temperature for the temperature interval above 300°C and for high frequencies the creep-like region becomes predominant, insert in
Figure 13a). This phenomenon can be attributed to release of point defects (space charge) [
51]. The distinguishing features are the emerging modes (maxima) in the region of intermediate frequencies involved by the electrode-sample interface.
The imaginary part Z’‘ of impedance as a function of frequency at different temperatures is shown in
Figure 13b. The plots exhibit two peaks: one at lower frequencies and a second one at higher frequencies. The major one is related to the electrode-surface phenomena, and the second peak originates from the sample bulk. The minor peak related to the crystal shifts towards high frequencies with increasing temperature, while its amplitude gradually diminishes. The peak indicates the maximum dielectric loss at the given frequency and attains a constant value in the high-frequency region. For frequencies below this peak, dipoles are completely polarized or aligned along the applied ac electric field and are in a stretched state. These observations show that the sample′s resistive properties were reduced and indicate the occurrence of relaxation processes in this temperature range. As temperature increased, thermal energy k
BT provides driving force to the movement of charges. A detailed shape analysis suggests that we are dealing with only one relaxation process from the sample.
The complex electric modulus M (real component M’ and imaginary M’‘) is the inverse of the complex permittivity, which is used to study dielectric relaxation processes in materials. The frequency dependences of M’ process is shown in
Figure 14a. M’ has very low values at lower frequencies and exhibits an increasing trend with the rise in frequency. When M′ approaches zero this behavior confirms the presence of an appreciable electrode and/or ionic polarization and represents an absence of the restoring energy for the mobile charge carriers in the studied temperature ranges. Generally, in the entire frequency range, the M’ values decrease with increasing temperature up to ~400°C. Above this temperature, the M’ values increase significantly with further temperature increase, especially in the high frequency range, resulting in a change in the dispersion image. This effect can be related to the increasing importance of ionic conductivity at high temperatures.
For high temperatures, a significant increase in M’ is observed with increasing frequency. Next, there is a “plateau” area where electrical processes are frequency independent. This area narrows as the samples are heated further. As the temperature increases, the slope of the M’(f) curves shifts towards higher frequencies, which is reflected in decreasing relaxation times. This phenomenon results from the increased activation of the short-range mobility of charge carriers or a gradual decrease in electron-lattice coupling [
33,
35].
M’ almost reaches zero at low frequencies due to the lack of electrical polarization and high dielectric losses and represents an absence of the restoring energy for the mobile charge carriers. M’ tends to reach a maximum (saturation) at high frequencies. This saturation can be connected to the fact that charge carriers move within a reducible range until the electric field changes become too rapid to induce the oscillation of charge carriers (vacancies).
Figure 14b shows the changes in the imaginary part of the electrical modulus M’‘ as a function of frequency, which denotes energy loss in the presence of an electric field. The evolution of M’‘ shows that with increasing temperature the maxima (peaks) shift to higher frequencies, which indicates that charge carriers become thermally stimulated with increasing temperature, resulting in a gradual movement (in other words: increasing temperature trigger faster ionic activity, which results in the peak shifting towards higher frequencies). The shorten the period and increase of the relaxation frequency, suggesting the presence of a temperature-dependent thermally activated relaxation process, dominated by the charge carrier hopping mechanism [
52]. In the low-frequency interval below the maximum of M’‘(f), carriers can hop from one site to another site (i.e., long-distance hopping exists). In the high-frequency interval above the maximum of M’‘(f), charge carriers move over a short distance (i.e., localized movement inside potential wells). At the same time, the broadening of the asymmetric peak of M’‘(f), particularly at higher temperatures can be ascribed to non-Debye type relaxation (a stretched exponential character of the relaxation time exists) and is typical of hopping ion conductivity [
53,
54,
55].
Figure 15 shows the normalized imaginary part of the M’‘/M’‘m
ax modulus as a function of frequency (log norm(f/f
max)) in a wide temperature range. The frequency was normalized to the point where M’‘(f) reaches the maximum value M’‘m
ax.. There is one overlapping relaxation curve (
Figure 15) with left side perturbations in the low-frequency region originating from electrode-sample interface. This clearly suggests the same activation energy of oxygen vacancies occurring on different time scales and that the distribution of the relaxation times is temperature independent. A good fit of the experimental curves with a Gaussian function is also shown (insert in
Figure 15). The value of FWHM evaluated from the normalized spectrum is greater than log[(2 + √3/(2 − √3)], and this indicates non-Debye-type behavior which is well supported by complex impedance and modulus plots.
The evolution of the conduction relaxation time as an inverse function of the inverse temperature is shown in
Figure 16. The most probably relaxation time τ is estimated from the position of M’‘m
ax. as a function of frequency, according to the relationship [
51]:
where
f is the relaxation frequency at the point M’‘m
ax..
The activation energy (E
a-rel.) in the conductivity relaxation was calculated from the modified Arrhenius equation:
where: τ
0 is the pre-exponential factor and is equal 5.6x10
-11 s for NBT single crystals.
The activation energy for conductivity relaxation (E
a-rel.) is equal to the free energy of charge carrier migration (hopping) between adjacent positions in the lattice [
37,
56]. However, the activation energy obtained from dc conductivity is the sum of both the creation and migration free energy of charge carriers. It was found from eq. (10) that E
a-rel. is equal 0.99 eV. The closeness of this activation energy with those obtained from dc conductivity (1.18 and 1.14 eV) indicates that dispersion of the conductivity is attributable to the hopping of charge carriers. Based on these results, we can concluded that the creation free energy should be close to zero, which suggest that the carrier concentration is temperature independent, i.e., the carriers are almost dissociated from traps. These activation energies are comparable to the activation energy of 0.8-1.1 eV obtained for diffusion of oxygen vacancies in perovskite oxides [
57,
58]. Such values of the activation energy for NBT single crystals are indicative of the ionic nature of the electric relaxation involved in the process.
The next stage of the research was the analysis of the Argand chart (M’ vs. M’‘) and the results are shown in
Figure 17. It is observed that the average radius of the arcs increases with increasing temperature, and the maximum values of M’‘m
ax, shift to the higher frequency area. This confirms that relaxation is a thermally activated process dominated by the charge carrier hopping mechanism. As expected, only one semicircle dominates in the tested material, and the presence of small additional ones probably results from processes occurring at the crystal-electrode interface.
Figure 18 shows the combined diagram of Z’‘ and M’‘ versus frequency. The peak Z’‘(f) and M’‘(f) do not overlap, which indicates that the relaxation process is dominated by the short-range movement of charge carriers (relaxation time is temperature independent) and departs from the Debye type conduction mechanism found from
Figure 14 [
59,
60,
61]. This also suggests that the conduction process may be localized [
62] in accordance with the above-mentioned prediction.
In oxide perovskites, oxygen vacancies (V
O) are thought to be one of the mobile charge carriers. In the NBT crysta, oxygen vacancies are generated by trace impurities of the reagents as well as the evaporation of Bi ion during the material processing. In general, they can occur in three states: the neutral state V
O (V
0O), the singly ionized V⃰
O (V
2+O) state, and the doubly ionized V⃰⃰ ⃰
O (V
2+O) states. The neutral-state vacancies may be thermally ionized to singly (V⃰
O) and doubly (V⃰⃰ ⃰
O) ionized states according to:
Conduction electrons released from neutral oxygen vacancies may trapped (localized) by Ti4+
(Ti′
Ti centers) and this generates a reduction of the valence following the relation:
Besides their association with Ti, these electrons can be weekly bonded (trapped) to oxygen vacancies, which can form a shallow level to trap electrons. However, it is difficult detect the precise location of the electrons, because this process can depend on local structure and temperature. Deficiency of electrons in p-type NBT (see below) favors the ionization of oxygen vacancies. The energy levels of Ti′
Ti centers are also shallow, and the electrons can easily hop via titanium ions contributing to charge transport. The thermal activation of the electrons trapped by this Ti or by oxygen vacancies can increase conduction. The electron hopping may take two pathways (i) direct hopping in an oxidation-reduction process between Ti ions according to relation (12), and (ii) jumping through the bridging oxygen vacancies between Ti ions according to relation (11). Activation energies for singly and doubly ionized oxygen vacancies are in the ranges 0.3-0.5 and 0.6-1.2 eV, respectively [
63,
64,
65], which suggested that, in our studies, double-ionized oxygen vacancies will be dominant way of generated in a higher temperature range than single ionized ones. The oxygen vacancies, electrons localized on titanium ion [
66,
67] and probably associated complexes based on them (Ti′
Ti -V⃰⃰ ⃰
O) ⃰ could be the more likely charge carriers involved in the conduction process in the high-temperature range conductivity of NBT single crystals. The associated complexes are rather unstable and gradually decompose during heating, releasing their more mobile components, which participate in the charge transfer. We should also remember the possibility of the recapture of the previously emitted electrons by oxygen vacancies. This can be due to oxygen vacancies becoming metastable at high temperatures. Thus, the conduction process can occur due to the hopping of electrons between Ti
4+ and Ti
3+, leading to the contribution of both single and doubly ionized oxygen vacancies and to the contribution of the hopping energy between these localized centers to the activation energy in the high-temperature range. The decrease of the dc conductivity activation energy from 1.26 eV to 1.18 eV at 450°C and from 1.18 eV to 1.14 eV at 553°C can be related to an increased concentration of doubly ionized vacancies and/or to increased electrons content. In summary, these results show that oxygen vacancies and hopping electron mechanism coexist in NBT single crystals and make an important contribution to the electric conductivity and determine the conduction relaxation process in the high-temperature range.
The oxide-ion conduction in NBT may originates from (i) Bi deficiency and oxygen vacancies created during the material processing [
21], and (ii) the highly polarizable Bi
3+ ion, which provide pathways with low diffusion barriers, favoring the migration of oxygen ions [
46,
47,
68]. In the low-temperature range, trapping of oxygen vacancies and their association with Bi vacancies makes their migration difficult or impossible and they do not contribute markedly to the long-range conduction process. In addition, most of the oxygen vacancies should be neutral in thermal equilibrium in this temperature interval due to the deep defect level, i.e., the Fermi level can be located above the defect level of the oxygen vacancy. However, as the temperature increases, due to the supplied thermal energy, the trapping energy gradually decreases and oxygen vacancies are released from the traps, gradually becoming ionized and releasing electrons. These vacancies and electrons contribute increasingly to electrical conductivity.
Complex impedance spectroscopy measured at high-temperatures captures the superposition of the electronic and ionic conductivity contributions. The contribution of electrons to charge carrier transfer, particularly in the high-temperature range can be related to the nonstoichiometry of NBT. As mentioned above, bismuth deficiency is one of the reasons for formation of oxygen vacancies in NBT. However, in our samples an excess of bismuth occurs. In this situation, a smaller number of oxygen vacancies and, consequently the emergence of electronic conductivity, should be expected. On the other hand, deficiency in sublattice O also occurs (see SEM/EDS and XPS results). The competitive influence of these non-stoichiometries may lead to an imbalance in the proportions between ionic and electronic conductivities. These results show that the possibility of modeling NBT single crystals with desired properties (particularly with expected electric conductivity) exists through careful control of stoichiometry, which can be achieved by minutely selection and examination of the precursors and in detail control/steering of crystal growth conditions.