Version 1
: Received: 29 July 2024 / Approved: 29 July 2024 / Online: 30 July 2024 (07:41:14 CEST)
How to cite:
Sobola, D.; Alsoud, A.; Knápek, A.; Mousa, M.; Schubert, R.; Kočková, P.; Škarvada, P. Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of the Epoxy Resin. Preprints2024, 2024072357. https://doi.org/10.20944/preprints202407.2357.v1
Sobola, D.; Alsoud, A.; Knápek, A.; Mousa, M.; Schubert, R.; Kočková, P.; Škarvada, P. Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of the Epoxy Resin. Preprints 2024, 2024072357. https://doi.org/10.20944/preprints202407.2357.v1
Sobola, D.; Alsoud, A.; Knápek, A.; Mousa, M.; Schubert, R.; Kočková, P.; Škarvada, P. Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of the Epoxy Resin. Preprints2024, 2024072357. https://doi.org/10.20944/preprints202407.2357.v1
APA Style
Sobola, D., Alsoud, A., Knápek, A., Mousa, M., Schubert, R., Kočková, P., & Škarvada, P. (2024). Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of the Epoxy Resin. Preprints. https://doi.org/10.20944/preprints202407.2357.v1
Chicago/Turabian Style
Sobola, D., Pavla Kočková and Pavel Škarvada. 2024 "Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of the Epoxy Resin" Preprints. https://doi.org/10.20944/preprints202407.2357.v1
Abstract
This paper reports results of analysis of field ion emission mechanism from tungsten-epoxy composite emitters that are compared to tungsten nano-field emitters. In this context, the mechanism of emission from this type of emitters is described based on a theory of induced conductive channels. The tungsten emitters were prepared using the electrochemical polishing technique and coated with a layer of the epoxy resin. Field ion microscope (FIM) analyses are reported including the study of the emission-ion density distributions from both the uncoated and coated emitters. Two forms of emission patterns have been observed in the ion emission microscopy technique describing the differences in the emission mechanism of both types of emitters. The observed results show: (a) the expected crystalline surface atomic distribution images of the field ion microscopy in the case of uncoated tungsten tips, and (b) randomly distributed emission spots that describe the locations of the induced conductive channels inside the resin coating layer.
Keywords
Field ion emission; tungsten atomic distribution; epoxy molecular distribution; composite field emitter; composite electron sources
Subject
Physical Sciences, Condensed Matter Physics
Copyright:
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
