TY  - GENERIC
DO  - 10.20944/preprints202409.1956.v1
UR  - http://dx.doi.org/10.20944/preprints202409.1956.v1
TI  - The Fréchet-Chen Distribution and Its Applications to Reliability Analysis of Electronic Devices
T2  - Preprints
AU  - Méndez-González, Luis Carlos
AU  - Rodríguez-Picón, Luis Alberto
AU  - González-Hernández, Isidro Jesús
AU  - Pérez-Olguín, Iván Juan Carlos
AU  - Quezada-Carreón, Abel Eduardo
PY  - 2024
DA  - 2024/09/25
PB  - Preprints