TY  - GENERIC
DO  - 10.20944/preprints202405.2009.v1
UR  - http://dx.doi.org/10.20944/preprints202405.2009.v1
TI  - Characterization of Na<sub>0.5</sub>Bi<sub>0.5</sub>TiO<sub>3</sub> Single Crystals by X-ray Diffraction, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Optical Absorption, Electric and Thermoelectric Properties Studies
T2  - Preprints
AU  - J.Suchanicz, Jan
AU  - Kluczewska-Chmielarz, Kamila
AU  - Jagło, Grzegorz
AU  - Kruk, Andrzej
AU  - Kania, Antoni
AU  - Sitko, Dorota
AU  - Nowakowska-Malczyk, Michalina
AU  - Łapiński, Marcin
AU  - Stachowski, Grzegorz
AU  - Kruzina, Tatiana
PY  - 2024
DA  - 2024/05/30
PB  - Preprints