ARTICLE
|
doi:10.20944/preprints202409.1716.v1
Subject:
Engineering,
Electrical And Electronic Engineering
Keywords:
waveform generation; BIST; ATE; DAC; low-cost; hardware synthesizable; on-chip
Online: 24 September 2024 (03:49:56 CEST)
ARTICLE
|
doi:10.20944/preprints202402.0250.v1
Subject:
Engineering,
Electrical And Electronic Engineering
Keywords:
self-testing; alternative testing; mixed-signal testing; manufacturing test; production test; built-in-self-test (BIST); self-calibration; self-healing; analog to digital converter (ADC)
Online: 5 February 2024 (08:12:34 CET)