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The Development of iDPC-STEM and Its Application in Electron Beam Sensitive Materials
Version 1
: Received: 5 May 2022 / Approved: 9 May 2022 / Online: 9 May 2022 (09:56:01 CEST)
A peer-reviewed article of this Preprint also exists.
Wang, H.; Liu, L.; Wang, J.; Li, C.; Hou, J.; Zheng, K. The Development of iDPC-STEM and Its Application in Electron Beam Sensitive Materials. Molecules 2022, 27, 3829. Wang, H.; Liu, L.; Wang, J.; Li, C.; Hou, J.; Zheng, K. The Development of iDPC-STEM and Its Application in Electron Beam Sensitive Materials. Molecules 2022, 27, 3829.
Abstract
The main aspects of material research: material synthesis, material structure, and material properties, are interrelated. Acquiring atomic structure information of electron beam sensitive materials by electron microscope, such as porous zeolites, organic-inorganic hybrid perovskites, metal-organic frameworks, is an important and challenging task. The difficulties in characterization of the structures will inevitably limit the optimization of their synthesis methods and further improve their performance. The emergence of integrated differential phase contrast scanning transmission electron microscopy (iDPC-STEM), a STEM characterization technique capable of obtaining images with high signal-to-noise ratio under lower doses, has made great breakthroughs in the atomic structure characterization of these materials. This article reviews the developments and applications of iDPC-STEM in electron beam sensitive materials, and provides an outlook on its capabilities and development.
Keywords
electron beam sensitive materials; electron microscopic characterization; low dose; iDPC-STEM
Subject
Physical Sciences, Condensed Matter Physics
Copyright: This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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