3.1. Case Studies
To better understand the cirrus statistical characteristics of large-ensemble simulations, the impacts of vertical motion and microphysical processes on cirrus evolution are first illustrated with the use of some case simulations. The first W time series shown in
Figure 1 (Wave1) was used to drive seven simulations, which correspond to the seven experiments listed in
Table 1. All these seven simulations had the same initial conditions: RH
i= 110%, T = 225 K, P = 250 hPa, N
i= 100 L
−1, the IC mass-weighted average radius (R
iq)= 15 μm, and the shape parameter of the gamma IC size distribution (μ
i) was 5. Besides the seven simulations, the REF experiment was also conducted again, with initial conditions of N
i= 10 L
−1 and R
iq= 30 μm, and was driven by another W time series (Wave2 in
Figure 1). Thus, there were a total of eight case simulations.
Figure 2 shows the results of these case simulations. At the beginning of the REF (Wave1) simulation (0~0.2 hour), all ICs grew because RH
i > 100%. As a result, q
i increased and RH
i decreased. Thereafter, the ice parcel went down (0.3~1 hour, see ΔH in
Figure 1). The RH
i dropped to below 100%, mainly due to the positive ΔT driven by ΔH (negative correlation between ΔT and ΔH). Meanwhile, the ICs began to sublimate. All ICs became smaller, and the small ICs vanished. Correspondingly, N
i dropped from 100 L
−1 to 3 L
−1. At about 1.8 hour, the increasing RH
i reached the heterogeneous freezing threshold (120~130%). The heterogeneous freezing occurred with the aid of the INPs, which came from the sublimated ICs. Correspondingly, N
i went back to 100 L
−1. In the subsequent simulation process, N
i hardly changed. The size of each IC increased or decreased according to the RH
i fluctuations, which were mainly driven by ΔT. It is noteworthy that ΔT is dominated by ΔH (i.e., vertical motion), and that the effect of latent heat from IC deposition/sublimation is negligible (not shown). In terms of water vapor, IC deposition/sublimation (i.e., the change in q
i) could directly change RH
i (total water conservation) and then pull RH
i towards 100% (negative feedback). Taken overall, vertical motion can be considered an active external force that changes the RH
i, while IC deposition/sublimation plays a role in mitigating the change in RH
i.
At the beginning of the REF (Wave2) simulation (
Figure 2), RH
i increased quickly and reached the homogeneous freezing threshold (150~160%). Homogeneous nucleation occurred and produced a lot of small ICs. Because the newly formed ICs (whose concentration was relatively high) grew by scavenging water vapor, the RH
i sharply fell to 100%. In the subsequent simulation, these small ICs would be the first to vanish during the sublimation phase (i.e., RH
i below 100%). This suggests that it is difficult for the small ICs produced by homogeneous freezing to survive for a long time if there are obvious vertical fluctuations.
As expected, both the Wamp and Wfre simulations showed that the maximum ΔH decreased as compared with the REF (Wave1) simulation (not shown). Therefore, the RH
i fluctuations in the Wamp and Wfre simulations also became weak, and all ICs could survive during the sublimation phase (
Figure 2). Furthermore, the maximum q
i from the Wamp and Wfre simulations was much lower than that from the REF experiment. This suggests that stronger RH
i fluctuations could help ICs to grow bigger (i.e., larger R
i). The above phenomenon is clearer in the Wno simulation. Because of IC deposition, the initial RH
i (110%) was reduced to 100% in the first half hour of the Wno simulation. It is reasonable to infer that the RH
i after 1 hour of simulation is almost not related to the initial RH
i. This is the reason why the first-hour-simulation results are not used in the following statistical analysis. In short, vertical motion (i.e., external forcing) controls the change in RH
i and determines cirrus evolution to some extent.
During the ICnosub simulation, all ICs could grow under RH
i > 100% but could not sublimate under RH
i <100% (
Figure 2). Correspondingly, q
i could only increase. As a result, the RH
i gradually decreased during the air parcel vertical fluctuation because more and more water vapor was absorbed by the ICs when RH
i > 100%. The ICadL and ICadH simulations explored the sensitivity to α
d. As mentioned above, IC deposition/sublimation could dampen the fluctuation of RH
i (negative feedback). This effect increased/decreased with an increasing/decreasing α
d. During the first sublimation phase of the ICadH simulation, all ICs vanished and released water vapor to prevent RH
i from decreasing. As compared to the REF (Wave1) simulation, the fluctuation of RH
i weakened in the ICadH simulation due to the stronger efficiency of the IC deposition/sublimation. On the contrary, the fluctuation of RH
i became stronger in the ICadL simulation. Note that a strong fluctuation could allow RH
i reach the homogeneous freezing threshold. After the occurrence of homogeneous nucleation, the huge number of ICs would bring the RH
i down to 100% due to their strong efficiency in scavenging water vapor. The comparison among the ICadL, ICadH, and REF (Wave1) simulations clearly indicates that IC deposition/sublimation could dampen the fluctuation of RH
i and make an impact on cirrus evolution.
3.2. Comparisons between the REF Experiment and Observations
This subsection illustrates the comparisons between the REF experiment (50 000 simulations) and observations (19679 samples). It is noteworthy that the simulation results with N
i < 1 L
−1 (only a very small part) were excluded from the statistical analysis, which is consistent with the observed samples. Furthermore, large-ensemble simulations provide very huge samples (i.e., model output time points). Therefore, only a small part of those samples (randomly selected) was used to create the plots below. The efficiency of ICs to scavenge/release water vapor is proportional to N
iR
i [
55,
56]. Here, N
iR
i is the sum of that from each IC's size bin. In the following analysis, N
iR
i is used to indicate the effect of IC deposition/sublimation on RH
i.
Figure 3 shows scatter plots of W, RH
i, and N
iR
i. The scatter plot of RH
i vs. W from the observations shows that the number of points (i.e., samples defined by RH
i and W) in the first (RH
i> 100% and W > 0 m s
−1) and third (RH
i< 100% and W< 0 m s
−1) quadrants is larger than that in the second (RH
i> 100% and W < 0 m s
−1) and fourth (RH
i< 100% and W > 0 m s
−1). This might be explained by the fact that RH
i increased when the air parcel rose (i.e., W > 0 m s
−1 and T is decreased), and RH
i decreased when the air parcel went down (i.e., W < 0 m s
−1 and T is increased). This characteristic also appears in the corresponding scatter plot from the REF experiment. The observation data show that the number of samples with higher N
iR
i (> 1000 μm L
−1) when RH
i > 125% is obviously larger than that when RH
i < 75%. The reason is that R
i begins to increase when RH
i > 100%, and N
i could possibly increase when RH
i > 125% (if ice nucleation occurs). When RH
i< 75%, ICs will have been sublimated for a while (R
i is decreased), and small ICs might vanish (N
i decreases). On the other hand, the number of samples with lower N
iR
i (< 100 μm L
−1) when RH
i < 75% is obviously larger than that when RH
i > 125%. Simulation results from the REF experiment also show these characteristics. In terms of the ICs’ impact on RH
i, a higher N
iR
i indicates that RH
i could be quickly pulled back to 100%. Therefore, RH
i is much closer to 100% when N
iR
i> 10000 μm L
−1. This phenomenon is more obvious in the REF experiment. The scatter plots of W vs. N
iR
i from both the observations and the REF experiment show that a higher N
iR
i usually goes together with a stronger fluctuation range for W. One possible reason is that the stronger W fluctuations could produce stronger RH
i fluctuations, which might trigger ice nucleation events (i.e., N
i is increased). Another possible reason is that ICs could grow bigger (i.e., larger R
i and q
i) under stronger W fluctuations (see case simulations). Generally speaking, these scatter plots from the REF experiment are similar to those from the observations.
Figure 4 shows the occurrence frequencies of RH
i and N
iR
i. The RH
i from the observations is mostly in the range of 50~150%. This is generally in agreement with previous studies [
12,
17,
18]. The occurrence frequency of RH
i from the REF experiment is very close to that from the observations. Furthermore, the occurrence frequency of N
iR
i from the REF experiment is also very close to that from the observations. Taken overall, the statistical characteristics of W, RH
i, and N
iR
i from the observations (
Figure 1,
Figure 3 and
Figure 4) could almost be reproduced by the REF experiment (large-ensemble simulations). This suggests that the wide range of RH
i in the observations (wave-related cirrus clouds) can be well explained by the vertical motion and IC deposition/sublimation (two mechanisms under the closed adiabatic assumption).
3.3. Deep Analysis through Sensitivity Experiments
In this subsection, the effects of the dynamical (vertical motion) and microphysical (IC deposition/sublimation) processes on RH
i fluctuations are further investigated through several sensitivity experiments. It is noteworthy that results from the Wno experiment are not shown in the figure below (i.e.,
Figure 5) because it is difficult to illustrate the special statistical characteristics in figures (almost all samples have RH
i= 100%, similar to the corresponding case simulation in
Figure 2). Furthermore, unless otherwise specified, the results of the sensitivity experiments are analyzed and compared with those of the REF experiment.
Without the vertical motion (i.e., the Wno experiment), the initial ICs scavenge/release water vapor, and then in most cases, RH
i is pulled to 100% after the first hour (not shown), except for a few simulations with a much lower initial RH
i (e.g., RH
i= 60%) and a very small initial q
i (i.e., ICs cannot provide enough water vapor). If RH
i= 100%, there are no changes in the air parcel (i.e., cirrus evolution is stopped). This again suggests that vertical motion (i.e., external forcing) controls the change in RH
i as well as cirrus evolution. After reducing the amplitude of the vertical motion by half (i.e., the Wamp experiment), the occurrence frequency distribution of W becomes narrow (
Figure 5). The occurrence frequency distribution of ΔT also becomes narrow due to the reduced W. The fluctuation of RH
i is mostly determined by ΔT. Therefore, the points (RH
i, W) in the scatter plots (
Figure 5) converge more towards the central point (RH
i= 100% and W= 0 m s
−1). After doubling the wave frequency of the vertical motion (i.e., the Wfre experiment), the curve of the spectrum analysis moves towards shorter periods (
Figure 5). As expected, ΔH is reduced by half (not shown). Therefore, the occurrence frequency distribution of ΔT becomes narrow, while the occurrence frequency distribution of W is almost unchanged (
Figure 5). Here, the relation between ΔT and W is not consistent with the approximated formula (δW = 0.23 δT) introduced in
Section 2.2. This suggests that the wave spectrum characteristic used in the Wfre experiment is not consistent with reality. Furthermore, the points (RH
i, W) in the scatter plot converge more towards the line of RH
i= 100% (
Figure 5). Although the occurrence frequency of W is similar to that in the observations, the scatter plot of RH
i vs. W is obviously different from the observations. This also suggests that the wave spectrum characteristic used in the Wfre experiment might not conform to reality. Both the Wamp and Wfre experiments show that RH
i is mainly within the range of 75~125% rather than 50~150% (
Figure 5). The main reason for the narrow range of RH
i is that the fluctuation of ΔT, which is mostly caused by W, is weakened. In short, both the amplitude and frequency of the vertical motion determine the change in RH
i during cirrus evolution.
Figure 6 shows the results of the sensitivity experiments for the IC deposition/sublimation process. In the scatter plots (both RH
i vs. W and RH
i vs. N
iR
i) from the ICnosub experiment, most points are at RH
i < 100% because the ICs can only scavenge water vapor. The scatter plot of RH
i vs. N
iR
i shows that the samples with higher N
iR
i (> 10 000 μm L
−1) are mostly from RH
i< 75%. The reason is that a higher N
iR
i usually indicates that most water vapor has been absorbed by the ICs. Because the ICs grew bigger (i.e., larger R
i) during the simulation without IC sublimation (see case simulations), it is more obvious in the scatter plot of W vs. N
iR
i from the ICnosub experiment that a higher N
iR
i usually goes with a wider range of W. Although the relative occurrence frequency of RH
i at around 100% from the ICadH experiment is obviously larger than that from the REF experiments, the three scatter plots from the ICadH experiment do not show any obvious differences. However, the differences between the scatter plots from the ICadL and REF experiments are obvious. Because the effect of IC deposition/sublimation is weakened, the range of RH
i becomes wider in the scatter plots of RH
i vs. W. The scatter plots of both RH
i vs. N
iR
i and W vs. N
iR
i show a big increase in the number of samples with higher N
iR
i (> 10000 μm L
−1). This can be explained by the fact that homogeneous nucleation occurs (a large number of ICs is produced) more frequently due to a stronger RH
i fluctuation. Because the efficiency of IC growth (i.e., the increase in R
i) is reduced, the phenomenon where a higher N
iR
i (excluding N
iR
i > 10000 μm L
−1) goes with a wider range of W becomes weak in the scatter plot of W vs. N
iR
i. As compared to the ICnosub and ICadH experiments, the number of lower N
iR
i (< 10 μm L
−1) is obviously increased in the ICadL experiment because smaller ICs could survive longer. In short, it is clear that IC deposition/sublimation can significantly impact RH
i as well as cirrus evolution.