The impact of
electron σ
n and hole σ
p capture cross-section in MAPbI
3 layer on perovskite cell is investigated by varying the capture cross-section area value from 2×10
−10 cm
2 to 2×10
−18 cm
2. The defect level is set to 0.5 eV above the valance band, while other parameters are kept constant such as defects density in the absorber layer, which is set to 2.5×10
13 cm
−3. The total density in both interfaces HTM and ETM are set to 10
18 cm
−2. The results are illustrated in
Figure 4.
As it is shown in
Figure 4a, when the value of the capture cross-section area in MAPbI
3 is greater than 2×10
−13 cm
2, the PCE is reduced sharply from 16.73 % to 0.86 %. In addition, when the capture cross-section area is set to be smaller than 2×10
−13 cm
2, the PCE is kept unchanged at 17.73 %. Furthermore, if the capture cross-section is great-er than 2×10
−13 cm
2, the PCE is decreased to about 0.86 %. The change of FF versus the capture cross-section in the MAPbI
3 absorber layer is shown in
Figure 4b, where FF varies slightly from 77.27 % to 76.89 %, due to the capture cross-section, which is less than 2×10
−13 cm
2. Once the capture cross-section reaches 2×10
−13 cm
2, the FF drops rapidly with the increase of the capture cross-section. As with other parameters, it is found that the J
sc changes slightly when the value of the capture cross-section is smaller than 2×10
−13 cm
2. The J
sc decreases significantly from 22.45 mA.cm
−2 to 4.23 mA.cm
−2, as the capture cross-section area increases gradually from 2×10
−13 cm
2 to 2×10
−10 cm
2. At the capture cross-section area of 2×10
−10 cm
2, the J
sc is approximately 4.23 mA.cm
−2. If the capture cross-section in the MAPbI
3 layer increases from 2×10
−13 cm
2 to 2×10
−10 cm
2, the V
oc decreases from 1.01 V to 0.67 V. In addition, the V
oc is kept unchanged when the capture cross-section area is set to be smaller than 2×10
−13 cm
2. To describe this theory, it is generally known that the carrier lifetime is strongly dependent on capturing cross-sections and the defect trap density. The capture cross-section depicts the probability of the trap catching the free carried item, thereby increasing the capture cross-section area for electrons and holes resulting in a decrease of a lifetime, as well as efficiency, fill factor, current density, and open circuit voltage. It is a good match to the recent research indicating that defects in the absorber layer have a significant impact on the cell’s performance [
17,
18]. Increasing the defects density and capture cross- section area within the selected range as it is shown in reference results in cell performance parameters: PCE = 17.72%, FF =77.23%, J
sc = 22.54 mA∙cm
−2, and V
oc = 1.01V. The increase of the defects density and capture cross-section have shown no impact on the performance parameters of the PSC in HTM and ETM layers. To ex-plain this, the role of the hole transportation layer HTM and electron transportation layer ETM is only to extract and convey the collected holes and electrons from the absorber region. Thus, there will have no significant im-pact.