To achieve this, the defect density was tuned from
1011 cm-3 to
1017 cm-3 to gain an insight into the carrier transport dynamics with respect to the magnitude of enrichment of the absorber for real practical situations. With the results obtained from the variation of PCE with absorber thickness [
Figure 3(f)], it was realized that it is pertinent to reduce the density of defects in the absorber of the simulated
CsSnI3-based PSC with thickness of
0.5µm and optimum
PCE. The selected absorber thickness is in agreement with previous results obtained for simulated
CsSnI3–based PSCs using SCAPS software [
78]. For selected thickness, the variation of the current density-voltage curves, the charge carrier recombination rate of the
CsSnI3-based PSC and the photovoltaic parameters (J
sc, V
oc, FF and PCE) with the absorber defect density are presented in
Figure 4. The current density remained constant with an average value of
32.60 mA.cm-2 for the defect density range of interest as evident from
Figure 4(c). The carrier lifetime increases from
0.05 ns to
50,000 ns as the defect density drops from
1017 cm-3 to 1011 cm-3 and this increment translates to diffusion lengths that are long enough to improve photovoltaic parameters and the PSC performance. Correspondingly, improved values were observed for
VOC,
FF, and
PCE as the absorber defect density decreases from
1017cm-3 to
1011 cm-3. FF has an optimum value of
80.13% when the absorber defect density was reduced to
1013 cm-3 with an equivalent
VOC of
1.055 V while the corresponding
PCE value is
27.565%. The need to reduce the noticeable high recombination rate at the n/i interface and in the absorber as depicted in
Figure 4(b) is necessary in order to improve the
VOC and the
PCE of the simulated
CsSnI3 –based PSC beyond the
Shockley-Queisser limit. Although, the initiative demonstrated above is one of the important strategies needed for the lead-free
PSCs to gain entry into the global PV markets but in real practical situations, it is difficult to synthesize
CsSnI3 absorber with a concentration of defect less than
1013 cm-3. This is because above room temperature, intrinsic defects are highly probable leading to the formation of significant concentration of
Sn4+ vacancy (
VSn) which in effect may promote recombination of holes with electrons in the stoichiometric
CsSnI3. Shallow doping of lead-free Sn-based perovskites using appropriate passivation additives (e.g.,
SnF2,
SnCl2), reducing agents (hypophosphorous acid (
HPA), hydrazine) and doping ions (
Br−,
PEA+,
pn+, and
TN+) have been reported in previous works to increase the formation energy of V
Sn and inhibit the oxidation of
Sn2+ to
Sn4+ [
80,
81,
82,
83,
84,
85,
86]. In this work, it is therefore compelling to preserve the intrinsic properties and improve the stability of
CsSnI3 absorber layer through enrichment using a combination of
SnCl2 and
Br− with appropriate concentration as additive and dopant respectively. This strategy would ensure a reduced concentration of
VSn and improve carrier lifetime beyond 0.05 ns as obtained for the initially simulated
CsSnI3–based PSC. For a fixed concentration of
Sn+4 vacancy, if cesium iodide interstitials were filled with varying concentrations of
Br- and the bulk enriched with
SnCl2, then the formation energy of
Sn+4 vacancy would increase and the oxidation of
Sn+2 to Sn+4 would be inhibited. For this work, a novel strategy was employed by fixing
NA=1014 cm-3, while
NV varies over a range of
1012 cm-3 to
1015 cm-3 and
ND also varies over a range of
103 cm-3 to
106 cm-3. Strategically, the equilibrium hole concentration in the enriched
CsSnI3 will decrease much more compared to that of the electron thereby making
CsSnI3 predominantly n-type. Thus, with
NC set to 10
15 cm
-3 and the optimum values for absorber thickness and total defect density (
Nt) set to
0.5µm and
1013 cm-3 respectively, a reduced
SRH recombination rate prevails leading to improved charge carrier collection efficiency and enhanced power conversion efficiency for the device. With these values, the
J-V curves,
QE curves and the photovoltaic parameters for the modified
CsSnI3-based
PSC are given in
Figure 5.
Figure 6 compares the results obtained for the initial
CsSnI3-based
PSC with that obtained for the optimized
CsSnI3-based
PSC. The overall quality and idealness of the optimized
CsSnI3-based PSC are more pronounced compared to the initial
CsSnI3-based PSC as evident from the high fill factor (
FF), enhanced open circuit voltage (
VOC) and short-circuit current density (J
SC) that ultimately gave rise to improved power conversion efficiency (PCE). From the J-V curves for the optimized
CsSnI3-based
PSC and that for the initial
CsSnI3–based PSC given in
Figure 6, we observed that the improvement in
VOC and
JSC for the optimized
CsSnI3-based
PSC are approximately 29% and 30% respectively higher compared to those for the initial
CsSnI3-based
PSC and this confirms efficient charge carriers transport and collection with minimal recombination rate. Thus, the resulting optimized
CsSnI3–based PSC performance parameters are
VOC = 1.289 V,
JSC = 32.60 mA.cm-2,
FF = 83.56% and
PCE = 35.12%.