Rutherford backscattering spectrometry (RBS) is a highly effective technique for elemental analysis and depth analysis technique of surface layers and thin films of solids, especially for the analysis of heavy elements on light elemental matrices.[7-9]. This non-destructive testing method is simple to perform and widely used for determining the thickness of thin films and the relative content of matrix elements. Due to its straightforward sample preparation, ease of operation, and reliable analytical results, RBS plays a crucial role in interdisciplinary research fields such as materials science, microelectronics, thin film physics, and energy[10-14].
Figure 1 shows the energy channel numbers and yields of SSNG graphite before and after isothermal annealing at 650°C for 9 h. It can be seen that the Xe
26+ peak broadens after 9 h of annealing, indicating that Xe
26+ diffuses after constant temperature annealing. The diffusion model is similar to a "sandwich" structure, as shown in
Figure 2. Firstly, Xe
26+ is injected into the graphite at a certain depth, and there is a Xe
26+ thickness layer under this depth, while the graphite injection side is considered to have almost no Xe
26+ residence, which is the model for determining the diffusion coefficient by ion injection, and the diffusion coefficient is obtained by the change of Xe
26+ residence layer thickness before and after annealing. Therefore, the diffusion coefficient D can be obtained directly from the data of the half height width (FWHM) of the concentration distribution peaks of Xe
26+ elements in the labeled layer before and after isothermal annealing. for the FWHM values, the Gauss peak function is required to fit the calculation to the distribution peaks of Xe in the RBS energy spectrum. The fitted peaks and FWHM values are obtained, and the fitting results are shown in
Figure 1.
The diffusive migration of xenon in graphite is simulated using classical Fickian diffusion kinetics and (effective) diffusion coefficients. The (effective) diffusion coefficient elaborated here combines all the fundamental transport coefficients due to physical and chemical phenomena (trapping, adsorption, graphite inhomogeneities, etc.) into one parameter, which is consistent with the approach used in contemporary fuel performance modeling. The diffusion experiment assumes that the rectangular flake sample is homogeneous and does not deviate from the ideal geometry, that the concentration of xenon on the graphite surface is zero (t > 0), and that the concentration of injected xenon is determined by the half-peak width of the xenon peak in the RBS plot of the xenon ion. However, to get the accurate diffusion coefficient, the detection system should also be calibrated with the energy scale using the Si sheet coated with Au film layer to correct the energy scale of the detection system and reduce the experimental error, and the calibration spectrum is shown in
Figure 3 and
Figure 4. The linear calibration equation is obtained from equations (14) and (15): KE
0=AC
N+B; the energy scale parameters of the detector with energy of 2 MeV (
4He
+) are obtained by the relationship between the energy channel number and kinematic factor of the calibration samples Au, Si, and C: A=2.36 keV/ch, B=105.4 keV, and then the relationship between channel number and concentration of xenon The relationship between energy and concentration is converted. After obtaining the thickness of the injected xenon ion layer by blocking the cross-section factor, the diffusion coefficient of xenon was calculated by the diffusion equation, and the diffusion coefficient of Xe
26+ at 650°C was calculated to be D(Xe,650°C) = 6.49 × 10
-20 m
2/s.
Suppose that at the center of the rectangular bar, P (x, y, z), the concentration of the substance is C. The mass of the diffuser entering the rectangular bar in the x-dx plane through the ABCD plane is:
where F
x is the transfer rate through the corresponding plane per unit area P. The amount of diffusive material lost through face A
1B
1C
1D
1 is:
Equation (2) - (3) yields:
Similarly, equations (5) and (6) are obtained.
The increase of diffusible material in the cell can be given by equation (7):
If the total amount of incoming diffusion material is equal to the increase of diffusion material in the cell, equation (8) is obtained from equations (4), (5), (6), and (7).
Equation (9) can be obtained from equations (8) and (1).
If the diffusion is one-dimensional, i.e., the concentration gradient is only in the x-direction; equation (9) is deformed to obtain equation (10).
The equation (10) is known as Fick's second law. The quantitative measurement of the rate at which a diffusion process occurs is expressed as a diffusion coefficient. For a one-dimensional diffusion process, the diffusion coefficient can be defined as the rate of transfer of the diffusing substance within a segment of units, divided by the spatial gradient of the concentration at that segment 3. If the rectangular bars in
Figure 1 represent SSNG graphite specimens implanted with Xe
26+, equation (10) can be solved by equation (11).
In equation (1), C is the concentration of Xe
26+ and t is time. When time t=0, C
0(x)=C(x,0) represents the initial iodine profile (i.e., the iodine profile before diffusion occurs). The profile measurement at t=0 can be approximated by equation (12).
In equation (1), K and t
0 are adjustable constants. Using the boundary condition
, it is simplified with equation (12) and (11) to equation (13).
If a profile W(t) is defined in such a way that
then equation (13) becomes equation (14)[
16];
Equation (14) can be used to obtain the diffusion coefficient, D. A plot of
versus t yields the diffusion coefficient (slope). The diffusion coefficient can be obtained by determining the slope 4Dln(2) of the unitary primary function, and
is determined using the FWHM of the Xe
26+peak. To obtain the activation energy E, the Arrhenius equation can be used.
In equation (15), D is the diffusion coefficient, D
0 is the pre-exponential factor, E is the activation energy, T is the absolute temperature and k is the gas constant.