Our proposed work, shown in
Figure 2, consists of a twin frequency control scheme (TFCS), an accurate load current sensing (ALCS) block, a switched capacitor (SC) integrator, two deadtime controller and the power train stage. In general, the output voltage, V
out, gives important information about the load current and this will be sensed by the proposed load current sensing block to produce a sensing voltage, V
sense. Furthermore, this voltage in turn gets compared with a 4-bit thermometer code ADC to produce a 4-bit signal (S
0, S
1, S
2 and S
3). This gives an accurate indication of the load current level drawn by the output of the DC-DC converter. The 4-bit signal goes through the TFCS which yields two non-overlapping clocks to control the switches in the switched-capacitor integrator and also a clock frequency to reset the integration cycle. In other words, it is meant to define the switching period of the buck converter. The integrated voltage, V
int, monitors V
x which gives an indication of the output load current and its corresponding voltage level. The integrated voltage, V
int, can be derived as:
where V
int is the integrated voltage and also the output of the SC integrator.
is the frequency of the switches in the SC integrator and
is the ratio of the capacitor which gives the gain of the amplifier.
refers to the input voltage of the DC-DC buck converter.
and T
s refer to the integration and switching period of the converter respectively.
With reference to equation (3), it is evident that the ratios of capacitors are a constant under any circumstances such as heavy or light load. The remaining parameters, except , are variables which will change according to the DC load power drawn by the output of the converter. Specifically, at light load condition, the above mentioned 4-bit signal (S0, S1, S2 and S3) will activate the proposed TFCS. This will alter the switching frequency of the DC-DC converter and the corresponding switches in the SC integrator. Hence, the switching losses of the buck converter will be significantly reduced at low current load condition. This will improve the power efficiency for the load range (<50mW) where the smartphone is idling.
1.1. Proposed Accurate Load Current Sensing (ALCS) Block
The proposed ALCS, shown in
Figure 3, is an extension and improvement to prior work [
17]. A more in-depth analysis with regard to prior work of current sensing techniques will be presented in the Appendix. It is used to sense the load current and gives an output sense voltage, V
sense via the sensing resistor, R
sense. This voltage level is proportional to the load current level. Transistors M
P1-M
P4 and M
N1-M
N3 form a current conveyor structure where negative feedback is employed which forces the node voltage V
1 to be equal to V
2 at a balanced state equilibrium. If the node V
2 increases, the drain voltage of MP3/gate voltage of M
P1 will increase since transistor M
N1 will force the mirrored current going through M
N3 to be the same. This action allows a larger net current going through M
P2, which gets mirrored over to M
P3. Hence, the gate voltage of M
P3 decreases which pulls node voltage V
3 down. This constitutes a negative feedback and forces V
2 to be equal to V
1. At the same time, the cascode pair M
P5 and M
P6 is included to increase the output impedance of the current mirror formed by M
P7 and M
P8. This will ensure a more accurate mirroring of current, behaving more like an ideal current source. Thus, transistors M
N6-M
N7 are stacked on top of M
N4-M
N5 to form a diode-connected configuration. This is at the expense of M
N4-M
N5 being biased in the linear triode region, with a larger value of transistor length.
Assume V1 to be equal to V2:
Substitute equation (6) into (7),
The output voltage, Vout, can be derived as:
If the ratio of the resistance R
load1/R
S << 1, equation (8) becomes:
At the same time, equation (9) is simplified as:
whereby R
load, total = R
load1 + R
load2.
Figure 3.
Accurate Load Current Sensing (ALCS) Block.
Figure 3.
Accurate Load Current Sensing (ALCS) Block.
The above derivation proves that the two passive resistors R
load1 and R
load2 contribute to the total load resistance without excessive power dissipation which will degrade the power efficiency of the overall DC-DC buck converter. Furthermore, the current, I
s, going through R
s is negligible, having minimal impact on the overall power efficiency. Hence, the sense voltage, V
sense can be derived to be:
Substitute equation (6) into (12),
If the ratio of the resistance Rload1/RS = ,
where
is a constant.
The above derivation of sense voltage, Vsense can be used to provide a voltage that is proportional to the load current. The power dissipation across the passive sensing resistor, Rsense is negligible as the current, Is, going through it is minimal. However, this sensing technique may have some drawbacks.
The above derivation and working operation assumes that the output voltage, Vout, is a constant value. But, in fact, there are some AC ripples riding on it. This is caused by the product of the inductor current ripple and the ESR of the output filtering capacitor. Thus, to ensure a more accurate load current sensing capability, the inductor value is made relatively larger to reduce the ripples riding on the output voltage. Furthermore, trimming techniques are employed for the resistor, Rsense as its value may differ by ±20% after the process of die fabrication. Therefore, careful consideration has to be taken into account when designing the next block as the resistor’s value due to process, voltage supply and temperature (PVT) variation should never exceed the 1-bit resolution of the ADC stage.
1.2. 4-Bit Thermometer Code ADC
The 4-Bit thermometer code ADC, shown in
Figure 4, is employed to compare the sense voltage, V
sense, with 4 voltage levels (V
r0, V
r1, V
r2 and V
r3) to generate a 4-bit thermometer code signal (S
0, S
1, S
2 and S
3). This gives vital information about the current load level. There are basically 4 different levels (0001, 0011, 0111 and 1111) which correspond to 4 different light load conditions. The resolution of the load current level can be improved at the expense of increasing the no. of comparators in the ADC which will increase conduction and switching losses that may degrade power efficiency. Hence, there exist a tradeoff between better resolution and power efficiency.
1.4. Power Train
The power train consists of one PMOS (M
P) and NMOS (M
N) device, as shown in
Figure 2. Both are 3.3V transistors which have a thicker gate oxide and occupy a much larger area than a regular transistor. Considering the power NMOS transistor M
N, the total power loss comprises of the sum of the switching and conduction loss as follow:
whereby C
gdn, C
gsn, C
dbn refers to the respective parasitic capacitance per unit width of the device, V
BATT is the input voltage to the buck converter, f
s refers to the switching frequency of the power train, R
on,N/W
N is the on-resistance per unit width, I
N refers to its RMS current and V
N is the gate voltage of the power NMOS transistor. Thus, the optimum width, W
opt,N, can be calculated when the switching loss is equal to the conduction loss, given by:
The optimized width for both the power NMOS and PMOS is shown in
Figure 6 where the graph of the switching loss intersects the conduction loss. The graph plot is based on the highest load current of 40mA and at a switching frequency of 1MHz. The aspect ratio and the on-resistance of the power transistors are shown in
Table 1. In addition, the on-resistance and input parasitic capacitance required to calculate the conduction and switching loss respectively, is the sum of simulation results and a theoretical calculation of the resistance/capacitance of metal routing/contact/via and the silicon area occupied by the layout of the power train. Since the optimized width has been finalized, it is now vital to find the best layout structure of the power train for our research application.
The efficiency of the power train is vital and depends largely on the layout structure which is a compromise between the total gate charge (Q
g) and the on-resistance (R
on) of the power transistors [
18]. This is because the area (W•L) of the power transistor is proportional to the total gate capacitance but inversely proportional to the on-resistance of the power transistor. Recent research [
19] proves that power transistors, which do not take into account of the resistance and parasitic capacitance of metal routing, will have an error variation of more than 50% in the calculation of Q
g and R
on. This is because the impact of the parasitic capacitance and resistance from layers of metal interconnection is extremely dependent upon the layout style of the power transistors and the positioning of its external source/drain connections. At the same time, the R
on is greatly affected by the distributed parasitic resistance associated with metal interconnects to the source and drain terminals. There are many past research efforts [
20,
21,
22] aim at improving and optimizing the layout of power transistor to minimize parasitic resistance and capacitance.
Traditionally, power transistors are designed with multi-finger layout structure to maximize the channel width per unit area which will increase the current handling capability. On the other hand, regular waffle layout structure was introduced [
21] to further optimize the width per area ratio by having four neighboring transistors, enclosing a centralized localized one. However, the above-mentioned layout structure does not yield the best optimum tradeoff between total gate capacitance (Q
g) and the on-resistance (R
on). Thus, in recent research work, there is an interesting proposal for a hybrid waffle layout structure [
23,
24] which proves that it can best optimize tradeoff between area, total gate charge and on-resistance.
However, in this research work, the above-mentioned hybrid waffle layout may not be suitable as this buck converter is not operating at extremely high frequency (>100MHz). Hence, our proposed layout is a tapered/matrix structure, as shown in
Figure 7, as it can provide a more uniform distribution of DC current among the fingers of the transistor. In addition, the fingers of the power transistor are designed in a diagonal way which will reduce the on-resistance and equalize the flow of current on opposite side of the device. Furthermore, the no. of fingers and multipliers for each power transistor are optimized, shown in Table. I, so as to balance the trade-off between total gate charge and parasitic interconnection resistance. One of the drawbacks is that there is a "hotspot" at the corner, furthest away from the centre of the power train. During measurement testing, this "hotspot" may increase the on-resistance of the power transistor, leading to an increase in the heat dissipation and ultimately degrading the power efficiency. Therefore, the die package must be thermally enhanced to avoid overheating of the silicon die chip or create other reliability issues. However, for our work, it focuses on a smartphone idling state (low load power) hence the above mentioned drawback may not be significant.