The main advantage of using this formalism lies in reducing the effect of electrode polarization.
Figure S4 in the SM shows the imaginary modulus for the starting NGP glass and GCs. A detailed analysis can also contribute to the understanding of electrical transport in GCs. The different processes present in crystallized samples are visible and easy to separate based on the value of resistance and capacity, i.e. relaxation time, using a graphic display of the frequency-dependent electrical modulus,
M’’(
ω), and imaginary component of the impedance,
Z’’(
ω). Both of these displays reveal one or more distinct maxima at specific frequencies, describing the corresponding relaxation process, which shifts towards higher frequencies with an increase in temperature. The frequency values of these relaxations can be correlated with the separation of the different contributions of individual phases to the total conductivity, which provides an insight into the mechanisms of conductivity in the investigated GCs and the influence of crystallization on the transfer of Na
+ ions as charge carriers.
It is indeed observed that the maxima in both the
M’’(
ω) and
Z’’(
ω) curves are closely aligned for the initial NGP glass, as can be seen in
Figure 8(a). This alignment suggests a non-localized relaxation process of the Debye type with a single relaxation time which implies that the observed phenomenon is a manifestation of the same underlying process, i.e. ionic conductivity. In contrast to the initial glass, the GC samples, which constitute heterogeneous systems comprising uniformly distributed crystalline grains within a glassy matrix, exhibit distinct characteristics. This is evident in the shape of the
Z’’(
ω) curve for NGP@450 sample, which displays two overlapped maxima. In contrast, a single maximum is observed in the
M’’(
ω) curve, and it closely matches the second of the two maxima in the
Z’’(
ω) curve, see
Figure 8(b). Since
M’’(
ω) reflects processes associated with reduced capacitance values, the presence of just one peak in the
M’’(
ω) curve implies that the prevailing process at higher frequencies is characterized by diminished capacitance values when compared to the process at lower frequencies. Given the substantial weight fraction of the remaining glassy matrix in NGP@450 sample, the high-frequency contribution is ascribed to the predominant amorphous phase, while the lower-frequency process might be associated with a grain boundary effect. This is further corroborated by the EEC modeling, see
Figure 5(b). Furthermore, the frequency dependence of
M’’(
ω) for NGP@500 sample reveals contributions from two separate relaxation processes, which overlapp due to similar relaxation frequencies. Conversely, a single peak is observed in
Z’’(
ω) curve, closely aligning with the first of the two maxima in the
M’’(
ω) curve, as depicted in
Figure 8(c). Considering that
Z’’(
ω) reflects processes characterized by higher resistance values, the presence of only one maximum in
Z’’(
ω) curve suggests that the process occurring at a lower frequency exhibits higher resistance values compared to the process observed at a higher frequency, effectively masking the latter. Taking into account weight fractions of two crystalline phases in NGP@500 GC, the high-frequency contribution is attributed to the majority NaPO
3 crystalline phase, while the lower-frequency process may be linked to the minority GeP
2O
7 crystalline phase, as previously depicted in
Figure 5(c). In the case of NGP@550, both the
M’’(
ω) and
Z’’(
ω) curves exhibit distinct individual contributions, much like those observed for NGP@500, see
Figure 8(d). Intriguingly, despite NGP@550 GC having nearly equal weight fractions of two crystalline phases, NaPO
3 and GeP
2O
7, as the NGP@500 GC, their
M’’(
ω) and
Z’’(
ω) curves exhibit differing shapes, a phenomenon also observed in their complex impedance planes, see
Figure 5(c,d). Namely, the
Z’’(
ω) curve of NGP@550 GC is broader compared to the
Z’’(
ω) curve of NGP@500 GC, which can be explained by the third contribution observed at the lowest frequencies. However, the three relaxation maxima overlap, making it challenging to separate them. On the other hand, in the
M’’(
ω) curve, the most prominent contribution is at the highest frequencies, and it can be attributed to the majority NaPO
3 phase (74.3%). Therefore, the processes characterized by the highest resistance appear to be a result of the presence of the additional GeP
2O
7 crystal phase and contributions from the grain boundary. As previously explained, the distinct contributions of the crystal grain boundary and the crystalline phases in NGP@550 GC emerge due to the formation of well-defined crystal grains and sharp grain boundaries. Elevated HT temperature may as well contribute to the sintering of crystal grains and reduce the specific surface area. As a result, the morphology of NGP@550 GC appears significantly more compact, as shown in
Figure 3, in contrast to NGP@500 GC, whose microstructure exhibits a more porous structure, as depicted in
Figure 2(c,d).