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Grating (Moiré) Microinterferometric Displacement/Strain Sensor with Polarization Phase Shift
Version 1
: Received: 2 April 2024 / Approved: 19 April 2024 / Online: 22 April 2024 (13:35:42 CEST)
A peer-reviewed article of this Preprint also exists.
Sałbut, L.; Łukaszewski, D.; Piekarska, A. Grating (Moiré) Microinterferometric Displacement/Strain Sensor with Polarization Phase Shift. Sensors 2024, 24, 2774. Sałbut, L.; Łukaszewski, D.; Piekarska, A. Grating (Moiré) Microinterferometric Displacement/Strain Sensor with Polarization Phase Shift. Sensors 2024, 24, 2774.
Abstract
Grating (moiré) interferometry is one of the well-known methods for full-field in-plane displacement and strain measurement. There are many design solutions for grating interferometers, including systems with a microinterferometric waveguide head. This article proposes a modification to the conventional waveguide interferometer head, enabling the implementation of a polarization fringe phase shift for automatic fringe pattern analysis. The article presents both the theoretical consideration of the proposed solution and its experimental verification, along with the concept of the in-plane displacement/strain sensor using the described head.
Keywords
grating (moiré) interferometry; waveguide sensor; polarization fringe phase shift; displacement measurement
Subject
Engineering, Control and Systems Engineering
Copyright: This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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